Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization

Shraddha Maheshwari; Rajat Bansal; Rishi Sharma; Shailendra Bisariya

Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization

March 2019

Vol-5, Issue-2

Paper ID: 9569

ISSN: 2395-4396

Downloads: 0

Abstract & Details

Research Area

Electronics and Communication Engineering

Keywords

Standard Cell area time power Library Characterization technology nodes- 180nm 90nm 45nm need for library characterization

Abstract

The focus of this paper is to study the parameters involved in the standard cell library characterization taking into account the three technologies nodes i.e., 180nm, 90nm & 45 nm. Commercial library cells are proprietary information of EDA companies. The companies usually impose certain restrictions on the access of these library cells. For example, Synopsys is offering Liberty NCX, Cadence has Virtuoso Foundation IP Characterization and MentorGraphics & Z-circuit technology (acquired by MentorGrapics) is offering Kronos for Standard Cell Library Characterization. Producing designs based on sub-micron technologies at a competitive cost has always been a challenge for manufacturers.

License

This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

Author Information

#	Name	Institute / Affiliation
1	Shraddha Maheshwari	ABES Engineering College
2	Rajat Bansal	ABES Engineering College
3	Rishi Sharma	ABES Engineering College
4	Shailendra Bisariya	ABES Engineering College

How to Cite

Use the following formats to cite this article in your research.

APA Style

Maheshwari, Shraddha, Bansal, Rajat, Sharma, Rishi, & Bisariya, Shailendra (2019). Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization. International Journal of Advance Research and Innovative Ideas In Education, 5(2), 350-354.

MLA Style

Maheshwari, Shraddha, et al. "Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization." International Journal of Advance Research and Innovative Ideas In Education, vol. 5, no. 2, 2019, pp. 350-354.

IEEE Style

Shraddha Maheshwari, Rajat Bansal, Rishi Sharma, and Shailendra Bisariya, "Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization," International Journal of Advance Research and Innovative Ideas In Education, vol. 5, no. 2, pp. 350-354, 2019.

Vancouver Style

Maheshwari Shraddha, Bansal Rajat, Sharma Rishi, Bisariya Shailendra. Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization. International Journal of Advance Research and Innovative Ideas In Education. 2019;5(2):350-354.

Harvard Style

Maheshwari, Shraddha, Bansal, Rajat, Sharma, Rishi, & Bisariya, Shailendra (2019) 'Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization', International Journal of Advance Research and Innovative Ideas In Education, 5(2), pp. 350-354.

Chicago Style

Maheshwari, Shraddha, et al. "Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization." International Journal of Advance Research and Innovative Ideas In Education 5, no. 2 (2019): 350-354.

Turabian Style

Maheshwari, Shraddha, et al. "Towards Automation Of 180nm, 90nm And 45nm Standard Cell Library Characterization." International Journal of Advance Research and Innovative Ideas In Education 5, no. 2 (2019): 350-354.