OUTLIER DATA MINING WITH IMPERFECT DATA LABELS
Abstract & Details
Research Area
Computer Engineering
Keywords
Outlier
SVDD
Kernels
Abstract
Clustering is a technique that group a similar object in a cluster some objects are different .which differently behaves to identify data objects that are markedly different from or inconsistent with the normal set of data is done by the outlier detection. Most existing solutions build a model using normal data and also identify outlier that do not fit represented model very proper. However, in addition to normal data, there also exist some limited negative examples or outliers in many applications that data and information may be corrupted such that the outlier detection data is imperfectly labeled. It creates outlier detection very different than compared to that of traditional ones. To address data with imperfect labels and incorporate limited abnormal example into learning is done by a novel outlier detection approach we are implementing RBF kernel and SVDD for the outlier detection. We are combining these two things and generate a best output for outlier detection.
License
This work is licensed under a Creative
Commons
Attribution-ShareAlike 4.0 International License.
Author Information
| # | Name | Institute / Affiliation |
|---|---|---|
| 1 | Dawange Yogesh Prakash | SND COE and RC Yeola |
How to Cite
Use the following formats to cite this article in your research.
APA Style
Prakash, Dawange Yogesh (2017). OUTLIER DATA MINING WITH IMPERFECT DATA LABELS. International Journal of Advance Research and Innovative Ideas In Education, 3(4), 895-901.
MLA Style
Prakash, Dawange Yogesh. "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS." International Journal of Advance Research and Innovative Ideas In Education, vol. 3, no. 4, 2017, pp. 895-901.
IEEE Style
Dawange Yogesh Prakash, "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS," International Journal of Advance Research and Innovative Ideas In Education, vol. 3, no. 4, pp. 895-901, 2017.
Vancouver Style
Prakash Dawange Yogesh. OUTLIER DATA MINING WITH IMPERFECT DATA LABELS. International Journal of Advance Research and Innovative Ideas In Education. 2017;3(4):895-901.
Harvard Style
Prakash, Dawange Yogesh (2017) 'OUTLIER DATA MINING WITH IMPERFECT DATA LABELS', International Journal of Advance Research and Innovative Ideas In Education, 3(4), pp. 895-901.
Chicago Style
Prakash, Dawange Yogesh. "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS." International Journal of Advance Research and Innovative Ideas In Education 3, no. 4 (2017): 895-901.
Turabian Style
Prakash, Dawange Yogesh. "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS." International Journal of Advance Research and Innovative Ideas In Education 3, no. 4 (2017): 895-901.
Related Research
Comprehensive Review of Existing Chatbot Systems for Career Assistance, Resume Support, and ATS-Aware Guidance
PDF Unavailable
Development of an AI-Powered Multimodal Web Assistant with Intelligent Resume Building and ATS Enhancement
PDF Unavailable
A Deep Learning-Based Framework for Mood-Oriented Music Recommendation Using Facial Expression Analysis
PDF Unavailable
Survey On : Intelligent Payroll and Human Resource Management Systems: A Systematic Review of Automation, Security, and Analytics
PDF Unavailable
Civic Engagement & Empowerment Platform
PDF Unavailable
Recent Developments in Microneedle Technology and Its Diverse Biomedical Applications
PDF Unavailable
RAG System Development with Pydantic AI ChromaDB & Groq
PDF Unavailable
Machine Learning Based Early Stage Diabetes Detection System
PDF Unavailable
A Survey on Skillsense:AI Career Analyzer App
PDF Unavailable
Employee Performance Portal
PDF Unavailable