OUTLIER DATA MINING WITH IMPERFECT DATA LABELS

July 2017
Vol-3, Issue-4
Paper ID: 6073
ISSN: 2395-4396
Downloads: 0

Abstract & Details

Research Area
Computer Engineering
Keywords
Outlier SVDD Kernels
Abstract
Clustering is a technique that group a similar object in a cluster some objects are different .which differently behaves to identify data objects that are markedly different from or inconsistent with the normal set of data is done by the outlier detection. Most existing solutions build a model using normal data and also identify outlier that do not fit represented model very proper. However, in addition to normal data, there also exist some limited negative examples or outliers in many applications that data and information may be corrupted such that the outlier detection data is imperfectly labeled. It creates outlier detection very different than compared to that of traditional ones. To address data with imperfect labels and incorporate limited abnormal example into learning is done by a novel outlier detection approach we are implementing RBF kernel and SVDD for the outlier detection. We are combining these two things and generate a best output for outlier detection.

Author Information

# Name Institute / Affiliation
1 Dawange Yogesh Prakash SND COE and RC Yeola

How to Cite

Use the following formats to cite this article in your research.

APA Style
Prakash, Dawange Yogesh (2017). OUTLIER DATA MINING WITH IMPERFECT DATA LABELS. International Journal of Advance Research and Innovative Ideas In Education, 3(4), 895-901.
MLA Style
Prakash, Dawange Yogesh. "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS." International Journal of Advance Research and Innovative Ideas In Education, vol. 3, no. 4, 2017, pp. 895-901.
IEEE Style
Dawange Yogesh Prakash, "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS," International Journal of Advance Research and Innovative Ideas In Education, vol. 3, no. 4, pp. 895-901, 2017.
Vancouver Style
Prakash Dawange Yogesh. OUTLIER DATA MINING WITH IMPERFECT DATA LABELS. International Journal of Advance Research and Innovative Ideas In Education. 2017;3(4):895-901.
Harvard Style
Prakash, Dawange Yogesh (2017) 'OUTLIER DATA MINING WITH IMPERFECT DATA LABELS', International Journal of Advance Research and Innovative Ideas In Education, 3(4), pp. 895-901.
Chicago Style
Prakash, Dawange Yogesh. "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS." International Journal of Advance Research and Innovative Ideas In Education 3, no. 4 (2017): 895-901.
Turabian Style
Prakash, Dawange Yogesh. "OUTLIER DATA MINING WITH IMPERFECT DATA LABELS." International Journal of Advance Research and Innovative Ideas In Education 3, no. 4 (2017): 895-901.

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