Cloth Tester Using Image Processing
Abstract & Details
Research Area
Electronics and Telecommunication Engineering
Keywords
Cloth Tester
defect detection
Abstract
In textile industry it is necessary and essential to inspect the defect in cloth and for quality control in the textile industry. This is a critical issue that leads to the difficulty for industry. Fabric inspection was traditionally is done humans eyes. The purpose of this report is to develop a prototype for Cloth Tester using image processing system to check the cloth is manufactured in proper manner. Researchers show attention towards automatic inspection systems to detect the detection efficiency. Hence automatic inspection scheme is introduced using smart cameras. The main purpose of this paper is to identify the damaged cloth and color bleeding. Besides this, this study aimed to identify the image processing technique using MATLAB. We have taken the output and displayed on 16x2 LCD display.
License
This work is licensed under a Creative
Commons
Attribution-ShareAlike 4.0 International License.
Author Information
| # | Name | Institute / Affiliation |
|---|---|---|
| 1 | Darshan Vyas | SKNSITS, Lonavala |
| 2 | Devashish Bhatkar | SKNSITS, Lonavala |
| 3 | Nikhil Patil | SKNSITS, Lonavala |
How to Cite
Use the following formats to cite this article in your research.
APA Style
Vyas, Darshan, Bhatkar, Devashish, & Patil, Nikhil (2016). Cloth Tester Using Image Processing. International Journal of Advance Research and Innovative Ideas In Education, 2(3), 3285-3289.
MLA Style
Vyas, Darshan, et al. "Cloth Tester Using Image Processing." International Journal of Advance Research and Innovative Ideas In Education, vol. 2, no. 3, 2016, pp. 3285-3289.
IEEE Style
Darshan Vyas, Devashish Bhatkar, and Nikhil Patil, "Cloth Tester Using Image Processing," International Journal of Advance Research and Innovative Ideas In Education, vol. 2, no. 3, pp. 3285-3289, 2016.
Vancouver Style
Vyas Darshan, Bhatkar Devashish, Patil Nikhil. Cloth Tester Using Image Processing. International Journal of Advance Research and Innovative Ideas In Education. 2016;2(3):3285-3289.
Harvard Style
Vyas, Darshan, Bhatkar, Devashish, & Patil, Nikhil (2016) 'Cloth Tester Using Image Processing', International Journal of Advance Research and Innovative Ideas In Education, 2(3), pp. 3285-3289.
Chicago Style
Vyas, Darshan, Devashish Bhatkar, and Nikhil Patil. "Cloth Tester Using Image Processing." International Journal of Advance Research and Innovative Ideas In Education 2, no. 3 (2016): 3285-3289.
Turabian Style
Vyas, Darshan, Devashish Bhatkar, and Nikhil Patil. "Cloth Tester Using Image Processing." International Journal of Advance Research and Innovative Ideas In Education 2, no. 3 (2016): 3285-3289.
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